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Near-field Simple Magnetic Field Probe Hand Tool H

GH₵ 339.00

GH₵ 677.0050%

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Order above GHC 150 on Jumia Express items & get free delivery | regular delivery from GH₵ 23.73 to Tema

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Delivery Fees GH₵ 33.25

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Description:

Magnetic field probes are mainly used for rectification of EMI space and conduction rectification.
The handle part is also shielded, reducing the impact of human hands on the probe.
Conducive to improving the accuracy of position detection.
Adopt a fully shielded structure, which greatly suppresses electromagnetic clutter interference in the external environment.
Frequency Range: 9KHz-7GHz

Specification:

Material: PCB

Size Chart:

Type III:
Extra Large(WxLxT): 5x10x0.42cm/1.96x3.93x0.16inch
Large(WxLxT): 2.1x10x0.42cm/0.82x3.93x0.16inch
Medium(WxLxT): 1.4x10x0.42cm/0.55x3.93x0.16inch
Small(WxLxT): 1x10x0.42cm/3.93x3.93x0.16inch
Electric Field Probe(TxLxL): 2.3x1x10/0.09x0.39x3.93inch

Package Includes:

As You Choose
A: 1 Each for Large, Medium, Small Probe(type III)
B: 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field Probe
C: 1 x Extra Large(type II)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field Probe
D: 1 x Extra Large(type III)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field Probe
E: 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe
F: 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field Probe
G: 1 x Extra Large (type II)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field Probe
H: 1 x Extra Large (type III)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field Probe

Note:

Color might be slightly different due to the color calibration of each individual monitor.
Please allow slightly measuring deviation due to manual measurement.

Near Field Probe;EMC EMI Near Field Probe Correction;Near-field Simple Magnetic Field Probe Hand Tool;Conducted Accessories Parts 9KHz-7GHz;9KHz-7GHz Near Field Probe Handle Type III Set;EMC EMI Near Field Probe Conduction Correction

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Specifications

Key Features

Magnetic field probes are mainly used for rectification of EMI space and conduction rectification.
The handle part is also shielded, reducing the impact of human hands on the probe.
Conducive to improving the accuracy of position detection.
Adopt a fully shielded structure, which greatly suppresses electromagnetic clutter interference in the external environment.
Frequency Range: 9KHz-7GHz

Easy to use
Exquisite Workmanship
Well Made
Best Choice and best discounts
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What’s in the box

As You ChooseA: 1 Each for Large, Medium, Small Probe(type III)B: 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field ProbeC: 1 x Extra Large(type II)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field ProbeD: 1 x Extra Large(type III)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Electric Field ProbeE: 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe F: 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field ProbeG: 1 x Extra Large (type II)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field ProbeH: 1 x Extra Large (type III)Probe, 1 Each for Large, Medium, Small Probe(type III), 1 x Composite Probe, 1 x Electric Field Probe